NASA TechBriefs Publishes LCR-Reader-MPA Whitepaper

Siborg published a white paper on TechBriefs about their newest device, the LCR-Reader-MPA. The paper gives insight to the devices’ capabilities and features.

The paper reviews how the device uses different measurement methods in order to produce high accuracy measurements, and the properties of operations. These operations include how the device is able to determine the type of component and test parameters to use. The paper also provides a short summary of the features and functions and an explanation how to use the Offset Removal feature.

The paper explains how LCR-Reader-MPA uses two methods of measuring capacitance using AC response method and DC charge/discharge methods. Using the AC response method allows the device to have a 0.1% basic accuracy for capacitances from 0.1 pf to 1 mF, the DC charge/discharge is more efficient in the range from 1 mF to 1 F.

The principle of operations is explained as “Voltage from the voltage source through a limiting 100 Ohm resistor is applied to the DUT connected at points A and B. The amplitude and frequency of the Test signal V are adjustable. The voltage drop on resistor Rj measured by DAj is proportional to the current flowing through the measured component. After digitizing the ADC signals the impedance is calculated according to the formula DUT impedance Z = Rj*Vau/Vaj.

For the Offset Elimination Technique is explained using the Capacitance Offset Calibration board; the dummy PCB uses holes to represent various sizes of components. Users place the tweezers’ tips in the corresponding hole to the component they are measuring and perform an open/closed calibration. The MPA will remove this value from the measured value, eliminating the value of any parasitics between the tweezers’ tips.

LCR-Reader Offset Calibration Board

“Initial values of the impedance (offsets) obtained during calibration with Open and Short probes are stored in the non-volatile memory of the device and are considered in the calculation in the impedance of the measured component thus eliminating the offset due to the device internal parasitics.”

LCR-Reader-MPA Task Kit

Siborg has released a new task kit that includes an LCR-Reader-MPA, accessories and an NIST traceable calibration certificate.

The LCR-Reader-MPA Professional task kit includes an MPA, NIST traceable calibration certificate, spare bent tweezer probes, LCR-Reader Kelvin Probe Connector kit, Offset Calibration Board, charging cable and manuals. An NIST traceable calibration certificate is a must for professional users that require their test equipment is routinely calibrated to ensure accuracy.

The Kelvin Probe Connector kit is a extension kit for all LCR-Reader and Smart Tweezer meters that replaces one of the gold probes with a wire lead. The kit comes with 5 different attachments for a wide range of tasks. When connected, the Kelvin Probe Connector Kit turns the MPA into a probe station, allowing to measure waveforms on various nodes on a PCB. This kit is exceptionally helpful when used with the Oscilloscope mode on MPA.

The LCR-Reader-MPA Professional is available for the grey or black display models and is available in the LCR-Reader Store and on Siborg’s North American sales channels.

LCR-Reader-MPA Well Received at Nepcon

Siborg debuted their LCR-Reader-MPA all-in-one multitester at Nepcon Korea in May. The audience showed great interest in the devices availabilities to test with efficiency and high 0.1% basic accuracy.

“This was the first presentation of the new LCR-Reader-MPA. EMK Nepcon has been proven to be a great place for us to debut devices in the past and this year was no different. We heard a lot of feedback from people, mostly interested in the wide range of applications and high accuracy of the MPA” says Michael Obrecht, the director of Siborg.

Electronics Manufacturing Korea (EMK) has become a globally renowned exhibition for domestic and foreign buyers and is Korea’s largest electronics manufacturing exhibition. Siborg has debuted both LCR-Reader and LCR-Reader-MP at Nepcon in 2014 and 2017 respectively.

LCR-Reader-MPA is a different from traditional multimeters that require set-up and have long wire leads. MPA’s compact design that combines a set of tweezers with a powerful multimeter. When in contact with a component, MPA will automatically determine the type of component and best test parameters to use for the highest accuracy measurements. All measurements are done with 0.1% basic accuracy and are instantly shown on the OLED display, including any secondary values (ESR, Q, D).

LCR-Reader-MPA Makes Debut at Nepcon 2019

Siborg Systems Inc. took their newest addition, the LCR-Reader-MPA to Nepcon Korea (may 15 to 17 2019) for its debut on the technology market.

“This is our first presentation of the newly competed LCR-Reader-MPA,” says the director of Siborg, Michael Obrecht, “We have shown devices in the past to welcoming audiences. Our multimeters are well received by consumers for their ease-of-use and high accuracy. We are excited to see what people have to say about the LCR-Reader-MPA at Nepcon Korea.”

Electronics Manufacturing Korea (EMK) has become the globally renowned exhibition for domestic and foreign buyers an is Korea’s largest electronics manufacturing exhibition. Since 2017, EMK has been co-hosted with ‘Autotronics Manufacturing Korea (AMK)’ and provides various seminars and events for visitors and exhibitors. Siborg is certain that LCR-Reader-MPA will be well received at this showing among the many other industry leaders.

LCR-Reader-MPA is the ultimate all-in-one multi tester with 0.1% basic accuracy and wide range of features including 100 kHz test frequency, current testing, LED/diode tests and automatic LCR/ESR measurements.